Secondary Ion Mass Spectrometry (SIMS) is one of the foremost techniques for surface analysis. Established for over 40 years, it reveals the chemical composition of both the extreme surface and near surface atomic layers. The information extends far beyond a simple elemental analysis to identify the molecular structure of organic compounds.
.jpg)
MiniSIMS benchtop surface analysis instrument: detailed depth profiling through powerful software tools.
The SAI MiniSIMS harnesses the power of the SIMS technique in a compact benchtop instrument. Requiring only a standard mains electricity supply for operation, it can be located wherever it is most needed. Low capital and maintenance costs, together with high sample throughput, mean that overall cost per sample can be 90% less than with conventional SIMS instrumentation.
| Attachment | Size |
|---|---|
| Analysis of self-assembled monolayers.pdf | 1.17 MB |
| Detecting surface contamination.pdf | 206.04 KB |
| Identifying surface contamination.pdf | 219.44 KB |
| Monitoring monolayer coatings.pdf | 215.84 KB |
| Monitoring nanoscale coatings.pdf | 268.63 KB |
| Use of the MiniSIMS with ftir.pdf | 725.45 KB |
| Use of the MiniSIMS with xps.pdf | 400.18 KB |
